The shift towards areal topography characterization is driving the adoption of optical measurement devices based on a range of multi-sensor technologies. The most utilized optical technologies for AM surfaces of metal parts may need a tactical approach to help fully characterize, combining results of profile lines and areal data.

The multi-sensor system TopMap Pro.Surf+ offers 1 nm vertical resolution and 1 μm XY resolution, allowing both the measurement of small and large features over larger areas. Ideal for both small and large spatial frequency measurements, measurements are fast, accurate and stable.